Das branchenweit erste flexible DUT-Interface von Advantest ermöglicht eine höhere Paralleltestkapazität auf den V93000 EXA Scale Testsystemen

Advantest Corporation (TSE: 6857), führender Anbieter von Halbleitertestsystemen, führt sein DUT Scale Duo Interface für die V93000 EXA Scale SoC Testsysteme auf dem Markt ein und ermöglicht so den höchsten Grad an Parallelität beim Testen innovativer Halbleiter. Das revolutionäre Interface Mehr

Advantest Again Distinguished as World’s #1 ATE Supplier and THE BEST Large Supplier of Chip Making Equipment in Annual Customer Satisfaction Survey

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced it has again topped the ratings chart of the 2022 TechInsights (formerly VLSIresearch) Customer Satisfaction Survey, capturing the No. 1 spot on this prestigious annual survey of global semiconductor Mehr

Advantest Announces New ACS University Program Allowing University Partners to Participate in the ACS Open Solution Ecosystem

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced it has launched the ACS University Program to allow its research partners to participate in the growing ACS ecosystem. Created to help customers achieve intelligent, data-driven workflows, the ACS Mehr

Advantest Rolls Out ACS Adaptive Probe Cleaning to Optimize Probe Card Cleaning Efficiency

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its industry-first ACS Adaptive Probe Cleaning (APC) solution to optimize the probe card cleaning cycle with efficacy. Part of Advantest’s ACS open solution ecosystem, APC has been proven with Mehr

Advantest Introduces Industry’s First Flexible DUT Interface Enabling Increased Parallelism on V93000 EXA Scale Test Systems

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has launched its DUT Scale Duo interface for the V93000 EXA Scale SoC test systems, enabling the industry’s highest level of parallelism for testing advanced semiconductors. With this revolutionary interface, the Mehr

Advantest führt die ACS Adaptive Probe Cleaning Lösung ein und optimiert dadurch die Effizienz der Reinigung von Probe Cards für den Chiptest

Advantest Corporation (TSE: 6857), führender Anbieter von Halbleitertestsystemen, kündigte heute die branchenweit erste ACS Adaptive Probe Cleaning (APC) Lösung an und optimiert damit den Reinigungszyklus von Probe Cards. Als Teil des offenen ACS Lösungsökosystems von Advantest hat sich APC bereits Mehr

Advantest Rolls Out ACS Adaptive Probe Cleaning to Optimize Probe Card Cleaning Efficiency

– Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) today announced its industry-first ACS Adaptive Probe Cleaning (APC) solution to optimize the probe card cleaning cycle with efficacy. Part of Advantest’s ACS open solution ecosystem, APC has been proven Mehr

Advantest ACS Nexus Enables Real-time Data Analytics for Semiconductor Test

Highlights: New ACS Nexus enables real-time data streaming from distributed test floors across the semiconductor supply chain for the analytics solutions of customers and third parties Strategic collaboration between Synopsys and Advantest enables real-time data analytics in Synopsys’ SiliconDash. Advantest’s Mehr

Advantest spendet 90 Millionen Yen zur Unterstützung von Hilfsaktionen für die Ukraine

Advantest Corporation (TSE: 6857), führender Anbieter von Halbleitertestsystemen, hat insgesamt 90 Millionen Yen für die Krisenhilfe in der Ukraine gespendet. Das Unternehmen hat damit folgende Organisationen unterstützt: Die Japanische Rotkreuzgesellschaft (Japan) Ärzte ohne Grenzen / Médecins Sans Frontières (Japan, USA, Mehr

Advantest Introduces Latest Image-Processing Engine for Testing CIS Devices Used in High-Resolution Smart Phones

Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has begun shipping the fourth generation of its high-speed image-processing engine that applies heterogeneous computing technology to detect defects in the data output from today’s most advanced CMOS image sensors (CIS). Mehr