Hamamatsu Photonics has developed a high-sensitivity, high-resolution semiconductor failure analysis system that utilizes visible to near-infrared light, all in just a single unit
Hamamatsu Photonics has developed a new semiconductor failure analysis system called the “PHEMOS-X C15765-01” that in just a single unit utilizes visible to near-infrared light to analyze semiconductor defects. What makes this possible is a newly mounted multi-wavelength laser scanner Mehr